Palavra-chave: SOI MOSFET

SUBSTRATE EFFECT TEMPERATURE SUBSTRATE PARASITIC BIPOLAR EFFECTS NEW DEVICES GC SOI MOSFET MEASUREMENTS OXIDE CHARGES ANALOG APPLICATIONS CURRENT MIRROR TUNABLE RESISTOR HARMONIC DISTORTION MOSFET-C FILTERS LOW TEMPERATURE DIBL FLOATING BODY DEEP-SUBMICROMETER DEVICE PROCESSING OPERATIONAL AMPLIFIER THRESHOLD VOLTAGE ANALYTICAL MODEL SIMULATION LOW TEMPERATURES DOUBLE GATE TRANSISTORS HIGH TEMPERATURE ELECTRICAL CHARACTERIZATION FINFET TRIPLE GATE NOISE STRAIN GATE-ALL-AROUND BUFFER MODELING MISMATCH JUNCTIONLESS NANOWIRE TRANSISTORS MULTIPLE GATE ZERO TEMPERATURE COEFFICIENT THREE-DIMENSIONAL NUMERICAL SIMULATION NANOTECNOLOGIA SELF-CASCODE TRANSISTOR ULTRA THIN BODY AND BOX - UTBB MULTIPLE-GATE TRANSISTORS MOBILITY EXTRACTION METHOD STACKED NANOWIRES GRADED-CHANNEL SOI MOSFET EFFECTIVE CHANNEL LENGTH EXTRACTION TRAP DENSITY NEW METHOD OXIDE CHARGE SUBTHRESHOLD SLOPE ACCUMULATIOM-MODE PARASITIC EFFECT NEW STRUCTURE SUBSTRATE INTERFACE SERIES RESISTANCE BURIED OXIDE INTERFACE SUBSTRATO MODELO ANALÍTICO BAIXA TEMPERATURA TENSÃO DE LIMIAR CIRCUIT SIMULATOR SOISPICE FABRICATION PROCESS SELF-HEATING EFFECT PROCESS TECHNOLOGY MATLAB HIGH FREQUENCY SUBMICROM METAL GATE HIGH-K DIELECTRICS CORNER EFFECTS RELIABILITY PIN DIODE PHOTODIODE JUNCTIONLESS SERIES ASSOCIATION MICROELECTRONICS STRAINED DEVICES MONTE CARLO SIMULATION CAPACITANCE LOW-FREQUENCY NOISE NUMERICAL SIMULATION SUBSTRATE BIAS NANOELECTRONICS NANOWIRE MOBILITY DEGRADATION CRYOGENICS CRYOELECTRONICS COMPACT MODELING NOVOS TRANSISTORES APLICAÇÕES EM CIRCUITOS FABRICAÇÃO CARACTERIZAÇÃO ELÉTRICA EFEITOS BIPOLARES PARASITÁRIOS RADIATION CIRCUITOS ANALÓGICOS ESPELHO DE CORRENTE DISTORÇÃO HARMÔNICA TRANSIENT EXTRAÇÃO DE PARÂMETROS SIMULAÇÃO TECNOLOGIA SOI MOSFET