Palavra-chave: SOI MOSFET

TEMPERATURE SUBSTRATE EFFECT SUBSTRATE PARASITIC BIPOLAR EFFECTS NEW DEVICES GC SOI MOSFET MEASUREMENTS OXIDE CHARGES ANALOG APPLICATIONS CURRENT MIRROR MOSFET-C FILTERS HARMONIC DISTORTION TUNABLE RESISTOR LOW TEMPERATURE FLOATING BODY DEEP-SUBMICROMETER DIBL DEVICE PROCESSING OPERATIONAL AMPLIFIER THRESHOLD VOLTAGE SIMULATION ANALYTICAL MODEL DOUBLE GATE TRANSISTORS LOW TEMPERATURES HIGH TEMPERATURE ELECTRICAL CHARACTERIZATION TRIPLE GATE FINFET NOISE STRAIN GATE-ALL-AROUND BUFFER MODELING MISMATCH MULTIPLE GATE JUNCTIONLESS NANOWIRE TRANSISTORS ZERO TEMPERATURE COEFFICIENT NANOTECNOLOGIA THREE-DIMENSIONAL NUMERICAL SIMULATION SELF-CASCODE TRANSISTOR ULTRA THIN BODY AND BOX - UTBB MULTIPLE-GATE TRANSISTORS MOBILITY EXTRACTION METHOD STACKED NANOWIRES GRADED-CHANNEL SOI MOSFET EFFECTIVE CHANNEL LENGTH TRAP DENSITY EXTRACTION OXIDE CHARGE NEW METHOD ACCUMULATIOM-MODE SUBTHRESHOLD SLOPE NEW STRUCTURE PARASITIC EFFECT SUBSTRATE INTERFACE SERIES RESISTANCE BURIED OXIDE INTERFACE MODELO ANALÍTICO SUBSTRATO BAIXA TEMPERATURA TENSÃO DE LIMIAR CIRCUIT SIMULATOR SOISPICE FABRICATION PROCESS SELF-HEATING EFFECT PROCESS TECHNOLOGY MATLAB HIGH FREQUENCY SUBMICROM METAL GATE HIGH-K DIELECTRICS CORNER EFFECTS RELIABILITY PIN DIODE PHOTODIODE JUNCTIONLESS SERIES ASSOCIATION MICROELECTRONICS STRAINED DEVICES MONTE CARLO SIMULATION CAPACITANCE LOW-FREQUENCY NOISE NUMERICAL SIMULATION SUBSTRATE BIAS NANOELECTRONICS NANOWIRE MOBILITY DEGRADATION CRYOELECTRONICS CRYOGENICS COMPACT MODELING FABRICAÇÃO CARACTERIZAÇÃO ELÉTRICA APLICAÇÕES EM CIRCUITOS EFEITOS BIPOLARES PARASITÁRIOS NOVOS TRANSISTORES RADIATION ESPELHO DE CORRENTE CIRCUITOS ANALÓGICOS DISTORÇÃO HARMÔNICA TRANSIENT EXTRAÇÃO DE PARÂMETROS SIMULAÇÃO TECNOLOGIA SOI MOSFET