Palavra-chave: SOI MOSFET

TEMPERATURE SUBSTRATE EFFECT SUBSTRATE GC SOI MOSFET PARASITIC BIPOLAR EFFECTS NEW DEVICES OXIDE CHARGES MEASUREMENTS ANALOG APPLICATIONS CURRENT MIRROR TUNABLE RESISTOR MOSFET-C FILTERS HARMONIC DISTORTION LOW TEMPERATURE DEEP-SUBMICROMETER DIBL DEVICE PROCESSING FLOATING BODY OPERATIONAL AMPLIFIER THRESHOLD VOLTAGE SIMULATION ANALYTICAL MODEL DOUBLE GATE TRANSISTORS LOW TEMPERATURES HIGH TEMPERATURE ELECTRICAL CHARACTERIZATION TRIPLE GATE FINFET NOISE STRAIN GATE-ALL-AROUND BUFFER MISMATCH MODELING MULTIPLE GATE JUNCTIONLESS NANOWIRE TRANSISTORS ZERO TEMPERATURE COEFFICIENT THREE-DIMENSIONAL NUMERICAL SIMULATION NANOTECNOLOGIA SELF-CASCODE TRANSISTOR ULTRA THIN BODY AND BOX - UTBB EXTRACTION METHOD MULTIPLE-GATE TRANSISTORS STACKED NANOWIRES MOBILITY GRADED-CHANNEL SOI MOSFET EFFECTIVE CHANNEL LENGTH TRAP DENSITY EXTRACTION OXIDE CHARGE NEW METHOD ACCUMULATIOM-MODE SUBTHRESHOLD SLOPE NEW STRUCTURE PARASITIC EFFECT SUBSTRATE INTERFACE SERIES RESISTANCE BURIED OXIDE INTERFACE MODELO ANALÍTICO SUBSTRATO BAIXA TEMPERATURA TENSÃO DE LIMIAR SOISPICE CIRCUIT SIMULATOR FABRICATION PROCESS SELF-HEATING EFFECT PROCESS TECHNOLOGY MATLAB HIGH FREQUENCY SUBMICROM METAL GATE HIGH-K DIELECTRICS CORNER EFFECTS RELIABILITY PIN DIODE PHOTODIODE JUNCTIONLESS SERIES ASSOCIATION MICROELECTRONICS STRAINED DEVICES MONTE CARLO SIMULATION CAPACITANCE LOW-FREQUENCY NOISE NUMERICAL SIMULATION SUBSTRATE BIAS NANOWIRE NANOELECTRONICS MOBILITY DEGRADATION COMPACT MODELING CRYOELECTRONICS CRYOGENICS FABRICAÇÃO NOVOS TRANSISTORES CARACTERIZAÇÃO ELÉTRICA EFEITOS BIPOLARES PARASITÁRIOS APLICAÇÕES EM CIRCUITOS RADIATION CIRCUITOS ANALÓGICOS ESPELHO DE CORRENTE DISTORÇÃO HARMÔNICA TRANSIENT EXTRAÇÃO DE PARÂMETROS SIMULAÇÃO TECNOLOGIA SOI MOSFET