Palavra-chave: CRYOELECTRONICS

ELECTRICAL CHARACTERIZATION JUNCTIONLESS NANOWIRE TRANSISTORS THRESHOLD VOLTAGE LOW TEMPERATURE ANALYTICAL MODEL MODELING PIN DIODE MOBILITY DEGRADATION STACKED NANOWIRES CRYOGENICS LOW TEMPERATURES DIODE GC SOI MOSFET SELF-CASCODE TRANSISTOR ANALOG APPLICATIONS MICROELECTRONICS HARMONIC DISTORTION NANOELECTRONICS MOSFET STRAINED DEVICES MULTIPLE-GATE TRANSISTORS COMPACT MODELING SOI MOSFET PARAMETER EXTRACTION NANOWIRE MOSFET NANOWIRE-BASED TRANSISTORS SELF-HEATING EFFECT CMOS TECHNOLOGY CMOS