Palavra-chave: CRYOGENICS

ELECTRICAL CHARACTERIZATION LOW TEMPERATURES STACKED NANOWIRES MULTIPLE-GATE TRANSISTORS NANOWIRE-BASED TRANSISTORS TEMPERATURE JUNCTIONLESS NANOWIRE TRANSISTORS CRYOELECTRONICS GATE INDUCED DRAIN LEAKAGE SOI MOSFET COMPACT MODELING NANOWIRE MOSFET LOW TEMPERATURE SELF-HEATING EFFECT CMOS TECHNOLOGY PARAMETER EXTRACTION SUBSTRATE BIAS NANOWIRE CMOS TCAD TRIDIMENSIONAL SIMULATION NANOSHEET MOSFET