Palavra-chave: MOSFET

STRAINED DEVICES SUBSTRATE BIAS SOI MOSFET LOW TEMPERATURES MOBILITY DEGRADATION NANOELECTRONICS PIN DIODE AMORPHOUS TFT MULTIPLE GATE NANOWIRE-BASED TRANSISTORS TCAD TRIDIMENSIONAL SIMULATION QUANTUM COMPUTING PIEZORESISTÊNCIA SELF-HEATING EFFECT TEST CHIP SIMULATION TEMPERATURE MICROFABRICAÇÃO HARMONIC DISTORTION TECNOLOGIA SOI SERIES RESISTANCE PLACA DE CIRCUITO IMPRESSO ELECTRICAL CHARACTERIZATION STACKED NANOWIRES TRANSIENT ANALOG APPLICATIONS CAPACITANCE OXINITRETO DE SILÍCIO SILÍCIO SILICIDE POLYSILICON FABRICATION PROCESS CRYOGENIC DIELÉTRICOS ANALYTICAL CONTINOUS MODEL PARAMETER EXTRACTION ÓXIDO DE SILÍCIO TRIPLE GATE ANALYTICAL MODEL SUBTHRESHOLD SLOPE PONTE H NANOFIOS TENSIONADOS MECANICAMENTE JUNCTIONLESS NANOWIRE TRANSISTORS MULTIPLE-GATE TRANSISTORS LOW-FREQUENCY NOISE CRYOELECTRONICS SILICON GERMANIUM NANOWIRE PIEZORESISTÊNCIA GIGANTE VEÍCULO ELÉTRICO MOBILITY NUMERICAL SIMULATION MODELING THIN-FILM TRANSISTOR NANOFIOS DE SILÍCIO PULSED MEASUREMENTS THRESHOLD VOLTAGE MICROELETRÔNICA PSEUDO-MOS FINFET