Palavra-chave: FINFET

MEASUREMENTS MONTE CARLO SIMULATION MOSFET MOS DEVICES ROTATED SUBSTRATE ROTATED DEVICES FOCUSED ION BEAM VOLTAGE GAIN DRAIN CURRENT CAPACITANCE SOURCE-FOLLOWER SIMULATION TEMPERATURE CMOS DEVICES EXTRACTION METHOD JUNCTIONLESS MULTIPLE GATE STRAINED DEVICES ANALYTICAL MODEL TRIPLE GATE LOW TEMPERATURE HIGH TEMPERATURE MOBILITY MOBILITY DEGRADATION JUNCTIONLESS NANOWIRE TRANSISTORS SI NANOWIRE SELF-HEATING EFFECT THRESHOLD VOLTAGE NANOWIRE-BASED TRANSISTORS ELECTRICAL CHARACTERIZATION MOSFET-C FILTERS STRAIN SOI MOSFET QUANTUM CORRECTION TRANSIENT HARMONIC DISTORTION HIGH-K DIELECTRICS CRYSTAL ORIENTATION TITANIUM NITRIDE LOW-FREQUENCY NOISE TRAP DENSITY NOISE GATE-ALL-AROUND DOUBLE GATE TRANSISTORS GC SOI MOSFET CIRCUIT SIMULATOR OPERATIONAL AMPLIFIER METAL GATE MULTIPLE-GATE TRANSISTORS BUFFER CORNER EFFECTS SERIES RESISTANCE COMPACT MODELING NANOELECTRONICS CIRCUITOS ANALÓGICOS ANALOG APPLICATIONS RELIABILITY