Palavra-chave: JUNCTIONLESS

MEASUREMENTS MOS DEVICES FOCUSED ION BEAM MODELING HETEROSTRUCTURE TRANSISTORS TEMPERATURE SIMULATION III-V COMPOUND SEMICONDUCTORS NH4OH ETCHING CMOS DEVICES TUNNELFET MULTIPLE GATE ANALYTICAL MODEL LOW TEMPERATURE JUNCTIONLESS NANOWIRE TRANSISTORS NANOTECNOLOGIA THREE-DIMENSIONAL NUMERICAL SIMULATION THRESHOLD VOLTAGE HBT ELECTRICAL CHARACTERIZATION VERTICAL MOSFET SOI MOSFET HARMONIC DISTORTION FINFET TITANIUM NITRIDE NANOELECTRONICS ANALOG APPLICATIONS