Palavra-chave: MEASUREMENTS

SERIES ASSOCIATION DIAGNOSIS JUNCTIONLESS NANOWIRE TRANSISTORS PARASITIC BIPOLAR EFFECTS LOW TEMPERATURE JUNCTIONLESS GC SOI MOSFET SIMULATION FINFET MODELING DEVICE PROCESSING THRESHOLD VOLTAGE METHODS ELECTRICAL CHARACTERIZATION OXIDE CHARGES DENTAL CARIES ANALOG APPLICATIONS MISMATCH VERTICAL HYDROFOIL FORCE AND PRESSURE SOI MOSFET HIGH TEMPERATURE SUBSTRATE EFFECT MULTIPLE GATE