Palavra-chave: MEASUREMENTS

LOW TEMPERATURE MODELING SOI MOSFET MISMATCH PARASITIC BIPOLAR EFFECTS HIGH TEMPERATURE VERTICAL HYDROFOIL MULTIPLE GATE DIAGNOSIS SIMULATION ANALOG APPLICATIONS SUBSTRATE EFFECT FINFET GC SOI MOSFET DEVICE PROCESSING SERIES ASSOCIATION METHODS DENTAL CARIES JUNCTIONLESS NANOWIRE TRANSISTORS THRESHOLD VOLTAGE FORCE AND PRESSURE JUNCTIONLESS OXIDE CHARGES ELECTRICAL CHARACTERIZATION