Palavra-chave: MEASUREMENTS

SOI MOSFET LOW TEMPERATURE PARASITIC BIPOLAR EFFECTS VERTICAL HYDROFOIL METHODS HIGH TEMPERATURE MULTIPLE GATE JUNCTIONLESS SIMULATION DIAGNOSIS OXIDE CHARGES ELECTRICAL CHARACTERIZATION ANALOG APPLICATIONS FORCE AND PRESSURE GC SOI MOSFET MISMATCH DEVICE PROCESSING DENTAL CARIES SERIES ASSOCIATION SUBSTRATE EFFECT JUNCTIONLESS NANOWIRE TRANSISTORS MODELING THRESHOLD VOLTAGE FINFET