Palavra-chave: MEASUREMENTS

JUNCTIONLESS NANOWIRE TRANSISTORS MULTIPLE GATE JUNCTIONLESS DEVICE PROCESSING MISMATCH ANALOG APPLICATIONS DIAGNOSIS GC SOI MOSFET LOW TEMPERATURE SERIES ASSOCIATION METHODS SIMULATION DENTAL CARIES VERTICAL HYDROFOIL FORCE AND PRESSURE ELECTRICAL CHARACTERIZATION OXIDE CHARGES HIGH TEMPERATURE FINFET MODELING SUBSTRATE EFFECT SOI MOSFET PARASITIC BIPOLAR EFFECTS THRESHOLD VOLTAGE