Palavra-chave: ELECTRICAL CHARACTERIZATION

LOW TEMPERATURE ANALYTICAL MODEL ZERO TEMPERATURE COEFFICIENT DIODE SOLAR CELL PARAMETER EXTRACTION DEVICE PHYSICS SELF-HEALING GATE INDUCED DRAIN LEAKAGE 3D PRINTING DEEP-SUBMICROMETER MICROELECTRONICS MULTIPLE-GATE TRANSISTORS CMOS MULTIPLE GATE ANALOG APPLICATIONS PHOTODIODE STACKED NANOSHEETS PIN DIODE FABRICATION PROCESS TRIPLE GATE CURRENT MIRROR JUNCTIONLESS NANOWIRE TRANSISTORS MOBILITY DEGRADATION THRESHOLD VOLTAGE HARMONIC DISTORTION JUNCTIONLESS MEASUREMENTS PULSED MEASUREMENTS FLOATING BODY CRYOELECTRONICS GRADED-CHANNEL SOI MOSFET VOLTAGE GAIN MICROCONTROLLER JUNCTIONLESS TRANSISTOR SOI MOSFET COMPACT MODELING ELECTROLUMINESCENCE RARE EARTH COMPLEXES VARIABILITY NOISE REDUCED GRAPHENE OXIDE BUFFER SELF-HEATING EFFECT MOSFET NANOSHEET MOSFET MULTILAYERS HIGH TEMPERATURE AUTOMAÇÃO SELF-CASCODE TRANSISTOR SIMULATION SELF-ASSEMBLY LBL ASSEMBLY BAND-GAP POLYMERS DEVICE PROCESSING DOUBLE GATE TRANSISTORS OXYGEN PLASMA SURFACE TREATMENT MECHANICAL PROPERTIES GATE-ALL-AROUND LAYER-BY-LAYER RELIABILITY INTERDIGITATED ELECTRODES LOW TEMPERATURES LOW-FREQUENCY NOISE PROCESS TECHNOLOGY TEST CHIP NANOWIRE MOSFET ORGANIC LIGHT EMITTING DIODES THREE-DIMENSIONAL NUMERICAL SIMULATION RING OSCILLATOR CAPACITANCE SPICE MODELING DYNAMIC MODEL DEVICES CMOS TECHNOLOGY STACKED NANOWIRES TEMPERATURE NANOTECNOLOGIA NANOPARTÍCULAS THERMAL RESISTANCE MOS DIODE STRAIN TCAD TRIDIMENSIONAL SIMULATION CRYOGENICS NANOWIRE FINFET GC SOI MOSFET MICROCHANNEL DIBL OPERATIONAL AMPLIFIER TRAP DENSITY CIRCUIT SIMULATOR SERIES RESISTANCE EFFECTIVE CHANNEL LENGTH NANOWIRE-BASED TRANSISTORS GRAPHENE OXIDE AUTOMONTAGEM MISMATCH ROTATED SUBSTRATE NUMERICAL SIMULATION ELECTRONIC TONGUE STRAINED DEVICES ULTRATHIN FILMS TUNABLE RESISTOR NANOELECTRONICS TRANSIENT MOBILITY LIGHT EMITTING DIODES RADIATION SENSORS E-TONGUE EXTRACTION METHOD TECNOLOGIA SOI SUBSTRATE BIAS FIELD EFFECT TRANSISTOR SOURCE-FOLLOWER SPLIT-CV TECHNIQUE CHITOSAN