Palavra-chave: ELECTRICAL CHARACTERIZATION

BAND-GAP POLYMERS STACKED NANOWIRES RARE EARTH COMPLEXES NANOTECNOLOGIA GATE INDUCED DRAIN LEAKAGE NANOSHEET MOSFET 3D PRINTING GRADED-CHANNEL SOI MOSFET BUFFER NANOPARTÍCULAS SUBSTRATE BIAS AUTOMONTAGEM SPLIT-CV TECHNIQUE ELECTROLUMINESCENCE LAYER-BY-LAYER SENSORS DEEP-SUBMICROMETER TEST CHIP SOURCE-FOLLOWER NANOWIRE MODELING DOUBLE GATE TRANSISTORS THRESHOLD VOLTAGE ORGANIC LIGHT EMITTING DIODES SERIES RESISTANCE JUNCTIONLESS NANOWIRE TRANSISTORS FLOATING BODY ZERO TEMPERATURE COEFFICIENT ULTRATHIN FILMS SELF-CASCODE TRANSISTOR JUNCTIONLESS DEVICE PROCESSING GRAPHENE OXIDE EFFECTIVE CHANNEL LENGTH LOW-FREQUENCY NOISE AUTOMAÇÃO ANALOG APPLICATIONS JUNCTIONLESS TRANSISTOR OPERATIONAL AMPLIFIER LOW TEMPERATURE NANOWIRE-BASED TRANSISTORS PROCESS TECHNOLOGY PIN DIODE SELF-HEALING RELIABILITY ANALYTICAL MODEL CMOS TECHNOLOGY NOISE SOLAR CELL MICROCHANNEL TEMPERATURE TRIPLE GATE DYNAMIC MODEL MOBILITY DEGRADATION CIRCUIT SIMULATOR GATE-ALL-AROUND THREE-DIMENSIONAL NUMERICAL SIMULATION MICROCONTROLLER FINFET EXTRACTION METHOD SOI MOSFET LIGHT EMITTING DIODES DEVICES RING OSCILLATOR MECHANICAL PROPERTIES TCAD TRIDIMENSIONAL SIMULATION STRAIN CRYOGENICS MULTILAYERS MISMATCH CAPACITANCE DIODE GC SOI MOSFET SELF-HEATING EFFECT CRYOELECTRONICS MICROELECTRONICS SPICE TECNOLOGIA SOI INTERDIGITATED ELECTRODES PARAMETER EXTRACTION TRANSIENT TUNABLE RESISTOR SELF-ASSEMBLY LBL ASSEMBLY LOW TEMPERATURES FIELD EFFECT TRANSISTOR ELECTRONIC TONGUE OXYGEN PLASMA SURFACE TREATMENT CHITOSAN DEVICE PHYSICS FABRICATION PROCESS VARIABILITY MULTIPLE-GATE TRANSISTORS MULTIPLE GATE NANOWIRE MOSFET MOSFET VOLTAGE GAIN NANOELECTRONICS PULSED MEASUREMENTS STRAINED DEVICES TRAP DENSITY COMPACT MODELING CURRENT MIRROR ROTATED SUBSTRATE MOS DIODE DIBL PHOTODIODE MEASUREMENTS REDUCED GRAPHENE OXIDE MOBILITY SIMULATION E-TONGUE CMOS HARMONIC DISTORTION STACKED NANOSHEETS RADIATION NUMERICAL SIMULATION HIGH TEMPERATURE