Palavra-chave: ELECTRICAL CHARACTERIZATION

THERMAL RESISTANCE STACKED NANOWIRES VOLTAGE GAIN ZERO TEMPERATURE COEFFICIENT SELF-HEALING SIMULATION DEVICE PHYSICS ELECTRONIC TONGUE FIELD EFFECT TRANSISTOR NUMERICAL SIMULATION TRIPLE GATE SPLIT-CV TECHNIQUE ANALYTICAL MODEL LOW TEMPERATURE PARAMETER EXTRACTION MOBILITY DEGRADATION SELF-HEATING EFFECT GATE INDUCED DRAIN LEAKAGE TUNABLE RESISTOR SOI MOSFET RADIATION NOISE JUNCTIONLESS TRANSISTOR DOUBLE GATE TRANSISTORS LBL ASSEMBLY NANOWIRE MOSFET DIODE NANOSHEET MOSFET NANOELECTRONICS TCAD TRIDIMENSIONAL SIMULATION SPICE RELIABILITY MODELING MICROCHANNEL CAPACITANCE TEMPERATURE DYNAMIC MODEL SOURCE-FOLLOWER PROCESS TECHNOLOGY CRYOELECTRONICS JUNCTIONLESS NANOWIRE DEVICE PROCESSING RING OSCILLATOR ORGANIC LIGHT EMITTING DIODES VARIABILITY THREE-DIMENSIONAL NUMERICAL SIMULATION THRESHOLD VOLTAGE SELF-ASSEMBLY AUTOMONTAGEM MISMATCH HARMONIC DISTORTION TECNOLOGIA SOI EFFECTIVE CHANNEL LENGTH ULTRATHIN FILMS FLOATING BODY LOW-FREQUENCY NOISE INTERDIGITATED ELECTRODES MULTILAYERS PHOTODIODE MICROCONTROLLER GATE-ALL-AROUND GC SOI MOSFET MULTIPLE-GATE TRANSISTORS BUFFER LIGHT EMITTING DIODES REDUCED GRAPHENE OXIDE MEASUREMENTS ROTATED SUBSTRATE 3D PRINTING CHITOSAN EXTRACTION METHOD STRAINED DEVICES MULTIPLE GATE SELF-CASCODE TRANSISTOR MOBILITY NANOTECNOLOGIA OXYGEN PLASMA SURFACE TREATMENT NANOWIRE-BASED TRANSISTORS SOLAR CELL CURRENT MIRROR RARE EARTH COMPLEXES E-TONGUE DIBL CMOS TRANSIENT GRADED-CHANNEL SOI MOSFET BAND-GAP POLYMERS OPERATIONAL AMPLIFIER MICROELECTRONICS SENSORS PULSED MEASUREMENTS LAYER-BY-LAYER SERIES RESISTANCE CRYOGENICS MOS DIODE FABRICATION PROCESS PIN DIODE SUBSTRATE BIAS MOSFET NANOPARTÍCULAS MECHANICAL PROPERTIES STACKED NANOSHEETS HIGH TEMPERATURE JUNCTIONLESS NANOWIRE TRANSISTORS DEEP-SUBMICROMETER TEST CHIP STRAIN CMOS TECHNOLOGY FINFET AUTOMAÇÃO GRAPHENE OXIDE TRAP DENSITY CIRCUIT SIMULATOR DEVICES ELECTROLUMINESCENCE COMPACT MODELING ANALOG APPLICATIONS LOW TEMPERATURES