Palavra-chave: ELECTRICAL CHARACTERIZATION

LOW TEMPERATURES ORGANIC LIGHT EMITTING DIODES NANOPARTÍCULAS ELECTROLUMINESCENCE ULTRATHIN FILMS NANOWIRE MOSFET HARMONIC DISTORTION MICROCONTROLLER TECNOLOGIA SOI FIELD EFFECT TRANSISTOR AUTOMAÇÃO ANALOG APPLICATIONS MISMATCH THERMAL RESISTANCE PARAMETER EXTRACTION INTERDIGITATED ELECTRODES LBL ASSEMBLY VARIABILITY NUMERICAL SIMULATION REDUCED GRAPHENE OXIDE MECHANICAL PROPERTIES SOLAR CELL MICROELECTRONICS DEVICES STRAINED DEVICES MOBILITY DEGRADATION SOI MOSFET RELIABILITY SELF-ASSEMBLY RADIATION DEVICE PHYSICS COMPACT MODELING PIN DIODE HIGH TEMPERATURE MULTIPLE GATE NANOWIRE-BASED TRANSISTORS TCAD TRIDIMENSIONAL SIMULATION OXYGEN PLASMA SURFACE TREATMENT PHOTODIODE SPLIT-CV TECHNIQUE STRAIN EXTRACTION METHOD DEEP-SUBMICROMETER MULTILAYERS SPICE EFFECTIVE CHANNEL LENGTH ANALYTICAL MODEL BUFFER DIODE DOUBLE GATE TRANSISTORS LIGHT EMITTING DIODES NANOTECNOLOGIA RING OSCILLATOR ROTATED SUBSTRATE CURRENT MIRROR TUNABLE RESISTOR PULSED MEASUREMENTS SENSORS THRESHOLD VOLTAGE SUBSTRATE BIAS PROCESS TECHNOLOGY CIRCUIT SIMULATOR CRYOGENICS MICROCHANNEL SELF-CASCODE TRANSISTOR JUNCTIONLESS AUTOMONTAGEM SELF-HEATING EFFECT SIMULATION TEMPERATURE MEASUREMENTS SERIES RESISTANCE TRANSIENT GRADED-CHANNEL SOI MOSFET SOURCE-FOLLOWER GC SOI MOSFET FABRICATION PROCESS SELF-HEALING GATE INDUCED DRAIN LEAKAGE RARE EARTH COMPLEXES ELECTRONIC TONGUE 3D PRINTING TRAP DENSITY JUNCTIONLESS NANOWIRE TRANSISTORS LOW-FREQUENCY NOISE DIBL CRYOELECTRONICS MOBILITY MODELING VOLTAGE GAIN NANOSHEET MOSFET OPERATIONAL AMPLIFIER LOW TEMPERATURE NANOELECTRONICS GRAPHENE OXIDE E-TONGUE TEST CHIP STACKED NANOWIRES MOS DIODE CAPACITANCE FLOATING BODY NOISE DYNAMIC MODEL DEVICE PROCESSING ZERO TEMPERATURE COEFFICIENT STACKED NANOSHEETS CMOS MOSFET TRIPLE GATE BAND-GAP POLYMERS MULTIPLE-GATE TRANSISTORS LAYER-BY-LAYER NANOWIRE JUNCTIONLESS TRANSISTOR CHITOSAN CMOS TECHNOLOGY GATE-ALL-AROUND THREE-DIMENSIONAL NUMERICAL SIMULATION FINFET