Palavra-chave: THRESHOLD VOLTAGE

SOI MOSFET LOW TEMPERATURES LOW TEMPERATURE NANOELECTRONICS JUNCTIONLESS NANOWIRE-BASED TRANSISTORS VOLTAGE REFERENCE TEST CHIP SIMULATION TEMPERATURE MEASUREMENTS TECNOLOGIA SOI ELECTRICAL CHARACTERIZATION STRAIN EXTRACTION METHOD DEEP-SUBMICROMETER PARAMETER EXTRACTION CMOS MOSFET ANALYTICAL MODEL DOUBLE GATE TRANSISTORS SUBSTRATE EFFECT SUBTHRESHOLD SLOPE JUNCTIONLESS NANOWIRE TRANSISTORS CRYOELECTRONICS VARIABILITY NANOTECNOLOGIA MODELING NANOSHEET MOSFET FINFET