Palavra-chave: THRESHOLD VOLTAGE

MEASUREMENTS MOSFET MODELING VOLTAGE REFERENCE TEMPERATURE SIMULATION JUNCTIONLESS CRYOELECTRONICS EXTRACTION METHOD ANALYTICAL MODEL PARAMETER EXTRACTION LOW TEMPERATURE JUNCTIONLESS NANOWIRE TRANSISTORS DEEP-SUBMICROMETER NANOTECNOLOGIA VARIABILITY NANOWIRE-BASED TRANSISTORS ELECTRICAL CHARACTERIZATION SUBTHRESHOLD SLOPE TEST CHIP STRAIN SOI MOSFET SUBSTRATE EFFECT CMOS TECNOLOGIA SOI FINFET DOUBLE GATE TRANSISTORS NANOSHEET MOSFET NANOELECTRONICS LOW TEMPERATURES