Palavra-chave: THRESHOLD VOLTAGE

LOW TEMPERATURE ANALYTICAL MODEL MODELING SOI MOSFET PARAMETER EXTRACTION VARIABILITY NANOWIRE-BASED TRANSISTORS TEMPERATURE DEEP-SUBMICROMETER NANOTECNOLOGIA NANOSHEET MOSFET MOSFET CMOS SIMULATION STRAIN SUBTHRESHOLD SLOPE NANOELECTRONICS VOLTAGE REFERENCE SUBSTRATE EFFECT FINFET DOUBLE GATE TRANSISTORS LOW TEMPERATURES JUNCTIONLESS NANOWIRE TRANSISTORS JUNCTIONLESS EXTRACTION METHOD MEASUREMENTS TEST CHIP TECNOLOGIA SOI CRYOELECTRONICS ELECTRICAL CHARACTERIZATION