Palavra-chave: MULTIPLE GATE

ANALOG APPLICATIONS ELECTRICAL CHARACTERIZATION JUNCTIONLESS NANOWIRE TRANSISTORS SOI MOSFET SIMULATION NANOELECTRONICS ANALYTICAL MODEL SELF-HEATING EFFECT NANOWIRE THREE-DIMENSIONAL NUMERICAL SIMULATION TEMPERATURE TRIPLE GATE METAL GATE HIGH-K DIELECTRICS FINFET EXTRACTION METHOD LOW TEMPERATURE RELIABILITY JUNCTIONLESS HIGH TEMPERATURE MEASUREMENTS MODELING STRAINED DEVICES SERIES RESISTANCE ROTATED SUBSTRATE LOW-FREQUENCY NOISE MOBILITY DEGRADATION STRAIN MOSFET NUMERICAL SIMULATION