Palavra-chave: MULTIPLE GATE

ELECTRICAL CHARACTERIZATION SOI MOSFET ANALOG APPLICATIONS JUNCTIONLESS NANOWIRE TRANSISTORS SIMULATION ANALYTICAL MODEL NANOELECTRONICS TEMPERATURE NANOWIRE SELF-HEATING EFFECT THREE-DIMENSIONAL NUMERICAL SIMULATION METAL GATE TRIPLE GATE HIGH-K DIELECTRICS FINFET LOW TEMPERATURE EXTRACTION METHOD RELIABILITY JUNCTIONLESS MEASUREMENTS HIGH TEMPERATURE MODELING STRAINED DEVICES SERIES RESISTANCE ROTATED SUBSTRATE LOW-FREQUENCY NOISE MOBILITY DEGRADATION STRAIN MOSFET NUMERICAL SIMULATION