Palavra-chave: ANALYTICAL MODEL

LEAKAGE CURRENT MOBILITY DEGRADATION VERILOG-A SOI MOSFET LOW TEMPERATURE COMPACT MODELING NANOELECTRONICS PIN DIODE MULTIPLE GATE JUNCTIONLESS NANOWIRE-BASED TRANSISTORS SIMULATION TEMPERATURE HARMONIC DISTORTION SOISPICE TECNOLOGIA SOI SERIES RESISTANCE TRANSDERMAL TRANSPORT ELECTRICAL CHARACTERIZATION STRAIN THREE-DIMENSIONAL NUMERICAL SIMULATION ANALOG APPLICATIONS SUBMICROM THRESHOLD VOLTAGE DATA FITTING NEW DEVICES GC SOI MOSFET SPICE GATE INDUCED DRAIN LEAKAGE EFFECTIVE CHANNEL LENGTH SHORT-CHANNEL EFFECTS PARAMETER EXTRACTION MOSFET DOUBLE GATE TRANSISTORS TRIPLE GATE SUBTHRESHOLD SLOPE TRAP DENSITY JUNCTIONLESS NANOWIRE TRANSISTORS LOW-FREQUENCY NOISE CRYOELECTRONICS NANOWIRE NANOTECNOLOGIA JUNCTIONLESS TRANSISTOR MATLAB MODELING DYNAMICMODEL ACCUMULATIOM-MODE PIEZOCOMPOSITE FINFET