Palavra-chave: PARAMETER EXTRACTION

MOBILITY DEGRADATION FINFETS CRYOGENICS LOW TEMPERATURE DEVICE PHYSICS PIN DIODE NANOELECTRONICS HIGH TEMPERATURE NANOWIRE-BASED TRANSISTORS TEST CHIP TEMPERATURE TECNOLOGIA SOI SERIES RESISTANCE ELECTRICAL CHARACTERIZATION STACKED NANOWIRES DEEP-SUBMICROMETER DEVICE MEASUREMENTS STACKED NANOSHEETS MOSFET ANALYTICAL MODEL SUBTHRESHOLD SLOPE JUNCTIONLESS NANOWIRE TRANSISTORS MULTIPLE-GATE TRANSISTORS LOW-FREQUENCY NOISE CRYOELECTRONICS NANOWIRE NANOTECNOLOGIA RING OSCILLATOR MOBILITY NUMERICAL SIMULATION MODELING CMOS TECHNOLOGY THRESHOLD VOLTAGE