Palavra-chave: PARAMETER EXTRACTION

STACKED NANOWIRES MOSFET MODELING TEMPERATURE DEVICE PHYSICS CRYOELECTRONICS NUMERICAL SIMULATION NANOWIRE ANALYTICAL MODEL LOW TEMPERATURE STACKED NANOSHEETS HIGH TEMPERATURE MOBILITY MOBILITY DEGRADATION JUNCTIONLESS NANOWIRE TRANSISTORS NANOTECNOLOGIA DEEP-SUBMICROMETER RING OSCILLATOR DEVICE MEASUREMENTS THRESHOLD VOLTAGE NANOWIRE-BASED TRANSISTORS ELECTRICAL CHARACTERIZATION SUBTHRESHOLD SLOPE TEST CHIP CMOS TECHNOLOGY TECNOLOGIA SOI FINFETS LOW-FREQUENCY NOISE MULTIPLE-GATE TRANSISTORS SERIES RESISTANCE CRYOGENICS NANOELECTRONICS PIN DIODE