Palavra-chave: PARAMETER EXTRACTION

LOW TEMPERATURE ANALYTICAL MODEL RING OSCILLATOR FINFETS MODELING DEVICE PHYSICS NANOWIRE-BASED TRANSISTORS CMOS TECHNOLOGY NUMERICAL SIMULATION DEVICE MEASUREMENTS STACKED NANOWIRES TEMPERATURE NANOTECNOLOGIA DEEP-SUBMICROMETER MULTIPLE-GATE TRANSISTORS MOSFET HIGH TEMPERATURE SUBTHRESHOLD SLOPE CRYOGENICS NANOELECTRONICS NANOWIRE STACKED NANOSHEETS MOBILITY PIN DIODE JUNCTIONLESS NANOWIRE TRANSISTORS MOBILITY DEGRADATION THRESHOLD VOLTAGE LOW-FREQUENCY NOISE SERIES RESISTANCE TECNOLOGIA SOI TEST CHIP CRYOELECTRONICS ELECTRICAL CHARACTERIZATION