Palavra-chave: PARAMETER EXTRACTION

STACKED NANOWIRES SERIES RESISTANCE JUNCTIONLESS NANOWIRE TRANSISTORS MULTIPLE-GATE TRANSISTORS RING OSCILLATOR NANOTECNOLOGIA MOSFET CRYOGENICS SUBTHRESHOLD SLOPE NANOELECTRONICS LOW-FREQUENCY NOISE CRYOELECTRONICS LOW TEMPERATURE TECNOLOGIA SOI NANOWIRE-BASED TRANSISTORS MOBILITY PIN DIODE ANALYTICAL MODEL CMOS TECHNOLOGY DEEP-SUBMICROMETER TEMPERATURE TEST CHIP MOBILITY DEGRADATION STACKED NANOSHEETS ELECTRICAL CHARACTERIZATION HIGH TEMPERATURE NANOWIRE NUMERICAL SIMULATION FINFETS DEVICE PHYSICS DEVICE MEASUREMENTS MODELING THRESHOLD VOLTAGE