Palavra-chave: COMPACT MODELING

JUNCTIONLESS NANOWIRE TRANSISTORS NANOWIRE-BASED TRANSISTORS LOW-FREQUENCY NOISE DOUBLE GATE TRANSISTORS DRAIN CURRENT FINFET GATE-ALL-AROUND TRIPLE GATE ELECTRICAL CHARACTERIZATION TCAD TRIDIMENSIONAL SIMULATION VARIABILITY ANALYTICAL MODEL GATE INDUCED DRAIN LEAKAGE LEAKAGE CURRENT TEST CHIP MODELING SPICE CIRCUIT SIMULATOR TRAP DENSITY TRANSCAPACITANCE CAPACITANCE TEMPERATURE STACKED NANOWIRES CRYOGENICS SOI MOSFET CRYOELECTRONICS NANOWIRE SIMULATION