Palavra-chave: COMPACT MODELING

JUNCTIONLESS NANOWIRE TRANSISTORS NANOWIRE-BASED TRANSISTORS LOW-FREQUENCY NOISE TRIPLE GATE DRAIN CURRENT FINFET DOUBLE GATE TRANSISTORS GATE-ALL-AROUND ELECTRICAL CHARACTERIZATION TCAD TRIDIMENSIONAL SIMULATION VARIABILITY LEAKAGE CURRENT GATE INDUCED DRAIN LEAKAGE ANALYTICAL MODEL TEST CHIP CIRCUIT SIMULATOR SPICE MODELING TRAP DENSITY TRANSCAPACITANCE CAPACITANCE TEMPERATURE STACKED NANOWIRES SOI MOSFET CRYOELECTRONICS CRYOGENICS SIMULATION NANOWIRE