Palavra-chave: COMPACT MODELING

NANOWIRE-BASED TRANSISTORS JUNCTIONLESS NANOWIRE TRANSISTORS LOW-FREQUENCY NOISE TRIPLE GATE DRAIN CURRENT DOUBLE GATE TRANSISTORS GATE-ALL-AROUND FINFET ELECTRICAL CHARACTERIZATION TCAD TRIDIMENSIONAL SIMULATION VARIABILITY LEAKAGE CURRENT ANALYTICAL MODEL GATE INDUCED DRAIN LEAKAGE SPICE TEST CHIP MODELING CIRCUIT SIMULATOR TRAP DENSITY TRANSCAPACITANCE CAPACITANCE TEMPERATURE STACKED NANOWIRES CRYOELECTRONICS CRYOGENICS SOI MOSFET SIMULATION NANOWIRE