Palavra-chave: STAR RHIC

SEMICONDUCTOR TECHNOLOGY SILICON DRIFT DETECTOR TRACKING DETECTORS BNL AGS CHARGED PARTICLE TRACKING SILVACO SIMULATION AUTOCAD SEMICONDUCTOR PROCESSING SILICON DRIFT DETECTOR DESIGN CHARGE COLLECTION RELATIVISTIC HEAVY-ION COLLISION ELIPTIC FLOW QUARK-GLUON PLASMA PT SPECTRA PROTON ANTI-PROTON RATIO RELATIVISTIC HEAVY ION COLLSION PSEUDO-RAPIDITY DISTRIBITION OF NEGATIVE PARTICLES TRANSVERSE MOMENTUM DISTRIBUTION NEGATIVELY CHARGED PARTICLES YIELDS 130 GEV HBT HBT CORRELATION WITH MULTIPLICITY SOURCE SIZE PIONS INTERFEROMETRY SILICON DRIFT DETECTORS PARTICLE IDENTIFICATION DOUBLE TRACK RESOLUTION 2D CHARGE CLUSTER FIT ELECTRONIC RESPONSE FUNCTION ELECTRON MOBILITY MAGNETO RESISTANCE ELECTRON TRANSPORT PROPERTIES IN SILICON MEASUREMENT AUTOMATIZATION IV-CV MEASUREMENTS MICRO PROBE TECHNOLOGY SEMICONDUCTOR QUALITY ASSURANCE TPC- TIME PROJECTION CHAMBER