Palavra-chave: STAR RHIC

TRACKING DETECTORS SEMICONDUCTOR TECHNOLOGY SILICON DRIFT DETECTOR BNL AGS CHARGED PARTICLE TRACKING SEMICONDUCTOR PROCESSING SILICON DRIFT DETECTOR DESIGN SILVACO SIMULATION CHARGE COLLECTION AUTOCAD ELIPTIC FLOW RELATIVISTIC HEAVY-ION COLLISION RELATIVISTIC HEAVY ION COLLSION PROTON ANTI-PROTON RATIO QUARK-GLUON PLASMA PT SPECTRA TRANSVERSE MOMENTUM DISTRIBUTION PSEUDO-RAPIDITY DISTRIBITION OF NEGATIVE PARTICLES NEGATIVELY CHARGED PARTICLES YIELDS 130 GEV PIONS INTERFEROMETRY SOURCE SIZE HBT HBT CORRELATION WITH MULTIPLICITY SILICON DRIFT DETECTORS PARTICLE IDENTIFICATION 2D CHARGE CLUSTER FIT DOUBLE TRACK RESOLUTION ELECTRONIC RESPONSE FUNCTION ELECTRON MOBILITY MAGNETO RESISTANCE ELECTRON TRANSPORT PROPERTIES IN SILICON MEASUREMENT AUTOMATIZATION MICRO PROBE TECHNOLOGY IV-CV MEASUREMENTS SEMICONDUCTOR QUALITY ASSURANCE TPC- TIME PROJECTION CHAMBER