Palavra-chave: STAR RHIC

SEMICONDUCTOR TECHNOLOGY TRACKING DETECTORS SILICON DRIFT DETECTOR CHARGED PARTICLE TRACKING BNL AGS SEMICONDUCTOR PROCESSING CHARGE COLLECTION SILVACO SIMULATION AUTOCAD SILICON DRIFT DETECTOR DESIGN ELIPTIC FLOW RELATIVISTIC HEAVY-ION COLLISION QUARK-GLUON PLASMA PROTON ANTI-PROTON RATIO PT SPECTRA RELATIVISTIC HEAVY ION COLLSION TRANSVERSE MOMENTUM DISTRIBUTION 130 GEV NEGATIVELY CHARGED PARTICLES YIELDS PSEUDO-RAPIDITY DISTRIBITION OF NEGATIVE PARTICLES HBT CORRELATION WITH MULTIPLICITY HBT PIONS INTERFEROMETRY SOURCE SIZE SILICON DRIFT DETECTORS PARTICLE IDENTIFICATION DOUBLE TRACK RESOLUTION ELECTRONIC RESPONSE FUNCTION 2D CHARGE CLUSTER FIT MAGNETO RESISTANCE ELECTRON TRANSPORT PROPERTIES IN SILICON ELECTRON MOBILITY MICRO PROBE TECHNOLOGY IV-CV MEASUREMENTS MEASUREMENT AUTOMATIZATION SEMICONDUCTOR QUALITY ASSURANCE TPC- TIME PROJECTION CHAMBER