Palavra-chave: REFRACTIVE INDEX

ION IMPLANTATION RUTHERFORD BACKSCATTERING SPECTROSCOPY SILICON DIOXIDE REAL TIME OPTICAL GAP ELECTRICAL RESISTIVITY MOLECULAR STRUCTURE SCANNING ELECTRON MICROSCOPY PLASMA POLYMER LIGHT-EMITTING DIODE ELECTRICAL CONDUCTIVITY INFRARED SPECTROSCOPY ABSORPTION COEFFICIENT HOLOGRAPHIC EXPOSURE PHOTORESISTOR INTERFEROMETRY ETHANOL OPTICAL EMISSION SPECTROSCOPY GLOW DISCHARGE CARBON NITRIDE PHOTORESIST THIN FILM DETECTOR OPTICAL CONSTANTS TITANIUM OXIDE DILL'S PARAMETER DIELECTRIC CONSTANT